Coull, J., Dickens, T., Ng, H., & Serna, J. (2022). Five hole probe errors caused by fluctuating incidence. EDP Sciences.
शिकागो शैली (17वां संस्करण) प्रशस्ति पत्रCoull, J., T. Dickens, H. Ng, और J. Serna. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
एमएलए (9वां संस्करण) प्रशस्ति पत्रCoull, J., et al. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
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