Coull, J., Dickens, T., Ng, H., & Serna, J. (2022). Five hole probe errors caused by fluctuating incidence. EDP Sciences.
Chicagoスタイル(17版)引用形式Coull, J., T. Dickens, H. Ng, , J. Serna. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
MLA(9版)引用形式Coull, J., et al. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
警告: この引用は必ずしも正確ではありません.