Coull, J., Dickens, T., Ng, H., & Serna, J. (2022). Five hole probe errors caused by fluctuating incidence. EDP Sciences.
芝加哥风格引文Coull, J., T. Dickens, H. Ng, 与 J. Serna. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
MLA引文Coull, J., et al. Five Hole Probe Errors Caused by Fluctuating Incidence. EDP Sciences, 2022.
警告：这些引文格式不一定是100％准确.