Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
A reduction in the focal depth of field as a result of the installation of aberration correctors in scanning transmission electron microscopy, allows three-dimensional information to be retrieved by optical depth sectioning. A three-dimensional representation of the specimen is achieved by recording...
| প্রধান লেখক: | , , , , , |
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| বিন্যাস: | Conference item |
| প্রকাশিত: |
2008
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