Dislocation locking in silicon by oxygen and oxygen transport at low temperatures
Dislocation-oxygen interactions in silicon have been studied experimentally and using numerical modelling. Experiments were performed to understand the locking of dislocations by oxygen and to measure the unlocking stress of dislocations in the temperature range 350-900degreesC for different anneali...
Principais autores: | Senkader, S, Giannattasio, A, Falster, R, Wilshaw, P |
---|---|
Formato: | Conference item |
Publicado em: |
Trans Tech Publications Ltd
2004
|
Registros relacionados
-
Dislocation locking by oxygen in silicon: New insights to oxygen diffusion at low temperatures
por: Senkader, S, et al.
Publicado em: (2002) -
Oxygen and nitrogen transport in silicon investigated by dislocation locking experiments
por: Giannattasio, A, et al.
Publicado em: (2005) -
Oxygen-dislocation interactions in silicon at temperatures below 700 degrees C: Dislocation locking and oxygen diffusion
por: Senkader, S, et al.
Publicado em: (2001) -
Locking of dislocations by oxygen in Cz-silicon
por: Senkader, S, et al.
Publicado em: (1999) -
On the locking of dislocations by oxygen in silicon
por: Senkader, S, et al.
Publicado em: (2001)