Investigation of grain boundaries for abnormal grain growth in polycrystalline SrTiO

Investigation of grain boundaries for abnormal grain growth in polycrystalline SrTiO

Strontium titanate (SrTiO) is widely used in electronic devices, and it is a model material for understanding the structural and dielectric properties of grain boundaries (GBs). In such materials, the GBs often play a dominant role in sintering and microstructural behavior. Abnormal grain growth (AG...

書誌詳細
主要な著者:	Shin, S, Lozano-Perez, S, Cockayne, D
フォーマット:	Journal article
出版事項:	2010

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