Polarization-dependent X-ray absorption spectroscopy of La2CuO4Fx thin films using synchrotron radiation
High-resolution polarization-dependent O K-edge x-ray absorption spectra for c-axis oriented La2CuO4Fx thin films were, investigated. In the O Is absorption edge of La2CuO4FX the prepeak at 528.7 eV is assigned to transitions into O 2pxy hole states located in the CuO2 planes. Fluoride ions present...
| Main Authors: | , , , |
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| Format: | Conference item |
| Published: |
2000
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