Some aspects of image projection in the field-ion microscope
The projection of ions in the field-ion microscope image of a tungsten specimen has been measured for a number of different conditions. It is well known that the relationship L = k theta holds, where theta is the angle from the tip axis. However, we have found that for a typical field-of-view the L...
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| Format: | Conference item |
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1999
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| _version_ | 1797084212806811648 |
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| author | Cerezo, A Warren, P Smith, G |
| author_facet | Cerezo, A Warren, P Smith, G |
| author_sort | Cerezo, A |
| collection | OXFORD |
| description | The projection of ions in the field-ion microscope image of a tungsten specimen has been measured for a number of different conditions. It is well known that the relationship L = k theta holds, where theta is the angle from the tip axis. However, we have found that for a typical field-of-view the L = k theta relationship also holds to a fair degree of accuracy for all angles in the image. The effect of off-axis projection is found to match a simple geometrical model, in which the ion trajectory with relation to the tip is assumed to be unaffected by the position of the screen or counter electrode. These results an important in determining the model to be used for accurate reconstruction of ion positions in the three-dimensional atom probe. (C) 1999 Elsevier Science B.V. All rights reserved. |
| first_indexed | 2024-03-07T01:52:15Z |
| format | Conference item |
| id | oxford-uuid:9a838443-2a25-436a-ae08-60d997cb895f |
| institution | University of Oxford |
| last_indexed | 2024-03-07T01:52:15Z |
| publishDate | 1999 |
| record_format | dspace |
| spelling | oxford-uuid:9a838443-2a25-436a-ae08-60d997cb895f2022-03-27T00:21:50ZSome aspects of image projection in the field-ion microscopeConference itemhttp://purl.org/coar/resource_type/c_5794uuid:9a838443-2a25-436a-ae08-60d997cb895fSymplectic Elements at Oxford1999Cerezo, AWarren, PSmith, GThe projection of ions in the field-ion microscope image of a tungsten specimen has been measured for a number of different conditions. It is well known that the relationship L = k theta holds, where theta is the angle from the tip axis. However, we have found that for a typical field-of-view the L = k theta relationship also holds to a fair degree of accuracy for all angles in the image. The effect of off-axis projection is found to match a simple geometrical model, in which the ion trajectory with relation to the tip is assumed to be unaffected by the position of the screen or counter electrode. These results an important in determining the model to be used for accurate reconstruction of ion positions in the three-dimensional atom probe. (C) 1999 Elsevier Science B.V. All rights reserved. |
| spellingShingle | Cerezo, A Warren, P Smith, G Some aspects of image projection in the field-ion microscope |
| title | Some aspects of image projection in the field-ion microscope |
| title_full | Some aspects of image projection in the field-ion microscope |
| title_fullStr | Some aspects of image projection in the field-ion microscope |
| title_full_unstemmed | Some aspects of image projection in the field-ion microscope |
| title_short | Some aspects of image projection in the field-ion microscope |
| title_sort | some aspects of image projection in the field ion microscope |
| work_keys_str_mv | AT cerezoa someaspectsofimageprojectioninthefieldionmicroscope AT warrenp someaspectsofimageprojectioninthefieldionmicroscope AT smithg someaspectsofimageprojectioninthefieldionmicroscope |