A SIMPLE TECHNIQUE FOR MEASURING DOPING EFFECTS ON DISLOCATION-MOTION IN SILICON
Váldodahkkit: | Roberts, S, Pirouz, P, Hirsch, P |
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Materiálatiipa: | Journal article |
Almmustuhtton: |
1983
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Geahča maid
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SIMPLE TECHNIQUE FOR MEASURING DOPING EFFECTS ON DISLOCATION MOTION IN SILICON.
Dahkki: Roberts, S, et al.
Almmustuhtton: (1983) -
TEM INVESTIGATION OF THE PLASTIC ZONE, DISLOCATION ROSETTES AND CRACKS AROUND VICKERS INDENTATIONS IN SILICON.
Dahkki: Samuels, J, et al.
Almmustuhtton: (1985) -
DOPING EFFECTS ON INDENTATION PLASTICITY AND FRACTURE IN GERMANIUM
Dahkki: Roberts, S, et al.
Almmustuhtton: (1985) -
SIMULTANEOUS OBSERVATION OF ALPHA-DISLOCATION AND BETA-DISLOCATION MOVEMENT AND THEIR EFFECT ON THE FRACTURE-BEHAVIOR OF GAAS
Dahkki: Warren, P, et al.
Almmustuhtton: (1984) -
EFFECTS OF DOPING ON MECHANICAL PROPERTIES OF SEMICONDUCTORS.
Dahkki: Hirsch, P, et al.
Almmustuhtton: (1986)