Single view metrology
We describe how 3D affine measurements may be computed from a single perspective view of a scene given only minimal geometric information determined from the image. This minimal information is typically the vanishing line of a reference plane, and a vanishing point for a direction not parallel to th...
| Main Authors: | , , |
|---|---|
| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
Springer
2000
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