Meyer, R., Kirkland, A., & Saxton, W. (2004). A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
芝加哥风格引文Meyer, R., A. Kirkland, 与 W. Saxton. A New Method for the Determination of the Wave Aberration Function for High-resolution TEM.; 2. Measurement of the Antisymmetric Aberrations. 2004.
MLA引文Meyer, R., et al. A New Method for the Determination of the Wave Aberration Function for High-resolution TEM.; 2. Measurement of the Antisymmetric Aberrations. 2004.
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