A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
A new method is presented for the determination of the antisymmetric coefficients of the wave aberration function from a tableau of tilted illumination images. The approach is based on measurements of the apparent defocus and two-fold astigmatism using a phase correlation function and phase contrast...
المؤلفون الرئيسيون: | Meyer, R, Kirkland, A, Saxton, W |
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التنسيق: | Journal article |
اللغة: | English |
منشور في: |
2004
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مواد مشابهة
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A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
حسب: Meyer, R, وآخرون
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"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
حسب: Kirkland, A, وآخرون
منشور في: (2004)