A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
A new method is presented for the determination of the antisymmetric coefficients of the wave aberration function from a tableau of tilted illumination images. The approach is based on measurements of the apparent defocus and two-fold astigmatism using a phase correlation function and phase contrast...
Hlavní autoři: | Meyer, R, Kirkland, A, Saxton, W |
---|---|
Médium: | Journal article |
Jazyk: | English |
Vydáno: |
2004
|
Podobné jednotky
-
A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
Autor: Meyer, R, a další
Vydáno: (2002) -
High resolution imaging using the Oxford aberration corrected TEM
Autor: Hetherington, C, a další
Vydáno: (2006) -
High-resolution TEM and the application of direct and indirect aberration correction.
Autor: Hetherington, C, a další
Vydáno: (2008) -
"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Autor: Kirkland, A, a další
Vydáno: (2004) -
"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
Autor: Kirkland, A, a další
Vydáno: (2004)