Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction

Over the past few years we have been pioneering the use of sub-nanosecond X-ray diffraction to determine the phase and compression of shocked crystals. It is well known that the deviation of atoms from their ideal lattice sites due to thermal motion reduces the integrated intensity within diffractio...

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Main Authors: Murphy, W, Higginbotham, A, Wark, J, Parkt, N
Format: Conference item
Published: 2007
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author Murphy, W
Higginbotham, A
Wark, J
Parkt, N
author_facet Murphy, W
Higginbotham, A
Wark, J
Parkt, N
author_sort Murphy, W
collection OXFORD
description Over the past few years we have been pioneering the use of sub-nanosecond X-ray diffraction to determine the phase and compression of shocked crystals. It is well known that the deviation of atoms from their ideal lattice sites due to thermal motion reduces the integrated intensity within diffraction peaks - the so-called Debye-Waller effect, and thus it is pertinent to investigate whether line ratios might be sufficiently sensitive to be used as a viable temperature diagnostic. Clearly the matter is not completely straight-forward, as the Debye frequency of a solid also varies under compression. In our initial investigations we have calculated the ratios of intensities of high-order reflections assuming various forms of the Gruneisen parameter, and have also compared these results with those obtained from Molecular Dynamics simulations. Given the photon energies of nanosecond X-ray pulses that can currently be produced, we comment on the experimental feasibility of the technique.
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spelling oxford-uuid:9f689c5e-5558-4fae-a407-d5c047333e332022-03-27T00:57:29ZTemperature measurements of shocked crystals by use of nanosecond X-ray diffractionConference itemhttp://purl.org/coar/resource_type/c_5794uuid:9f689c5e-5558-4fae-a407-d5c047333e33Symplectic Elements at Oxford2007Murphy, WHigginbotham, AWark, JParkt, NOver the past few years we have been pioneering the use of sub-nanosecond X-ray diffraction to determine the phase and compression of shocked crystals. It is well known that the deviation of atoms from their ideal lattice sites due to thermal motion reduces the integrated intensity within diffraction peaks - the so-called Debye-Waller effect, and thus it is pertinent to investigate whether line ratios might be sufficiently sensitive to be used as a viable temperature diagnostic. Clearly the matter is not completely straight-forward, as the Debye frequency of a solid also varies under compression. In our initial investigations we have calculated the ratios of intensities of high-order reflections assuming various forms of the Gruneisen parameter, and have also compared these results with those obtained from Molecular Dynamics simulations. Given the photon energies of nanosecond X-ray pulses that can currently be produced, we comment on the experimental feasibility of the technique.
spellingShingle Murphy, W
Higginbotham, A
Wark, J
Parkt, N
Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title_full Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title_fullStr Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title_full_unstemmed Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title_short Temperature measurements of shocked crystals by use of nanosecond X-ray diffraction
title_sort temperature measurements of shocked crystals by use of nanosecond x ray diffraction
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AT higginbothama temperaturemeasurementsofshockedcrystalsbyuseofnanosecondxraydiffraction
AT warkj temperaturemeasurementsofshockedcrystalsbyuseofnanosecondxraydiffraction
AT parktn temperaturemeasurementsofshockedcrystalsbyuseofnanosecondxraydiffraction