New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.

Confocal and multiphoton microscopes are particularly sensitive to specimen- or system-induced aberrations, which result in decreased resolution and signal-to-noise ratio. The inclusion of an adaptive optics correction system could help overcome this limitation and restore diffraction-limited perfor...

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Main Authors: Booth, M, Neil, M, Wilson, T
Format: Journal article
Language:English
Published: 2002
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author Booth, M
Neil, M
Wilson, T
author_facet Booth, M
Neil, M
Wilson, T
author_sort Booth, M
collection OXFORD
description Confocal and multiphoton microscopes are particularly sensitive to specimen- or system-induced aberrations, which result in decreased resolution and signal-to-noise ratio. The inclusion of an adaptive optics correction system could help overcome this limitation and restore diffraction-limited performance, but such a system requires a suitable method of wave-front measurement. By extending the concept of a modal wave-front sensor previously described by Neil et al. [J. Opt. Soc. Am. A 17, 1098-1107 (2000)], we present a new sensor capable of measuring directly the Zernike aberration modes introduced by a specimen. This modal sensor is particularly suited to applications in three-dimensional microscopy because of its inherent axial selectivity; only those wave fronts originating in the focal region contribute to the measured signal. Four wave-front sensor configurations are presented and their input response is characterized. Sensitivity matrices and axial responses are presented.
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spelling oxford-uuid:a1d5c215-3f12-4ed3-8bc1-20f9a8db23362022-03-27T02:16:02ZNew modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:a1d5c215-3f12-4ed3-8bc1-20f9a8db2336EnglishSymplectic Elements at Oxford2002Booth, MNeil, MWilson, TConfocal and multiphoton microscopes are particularly sensitive to specimen- or system-induced aberrations, which result in decreased resolution and signal-to-noise ratio. The inclusion of an adaptive optics correction system could help overcome this limitation and restore diffraction-limited performance, but such a system requires a suitable method of wave-front measurement. By extending the concept of a modal wave-front sensor previously described by Neil et al. [J. Opt. Soc. Am. A 17, 1098-1107 (2000)], we present a new sensor capable of measuring directly the Zernike aberration modes introduced by a specimen. This modal sensor is particularly suited to applications in three-dimensional microscopy because of its inherent axial selectivity; only those wave fronts originating in the focal region contribute to the measured signal. Four wave-front sensor configurations are presented and their input response is characterized. Sensitivity matrices and axial responses are presented.
spellingShingle Booth, M
Neil, M
Wilson, T
New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title_full New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title_fullStr New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title_full_unstemmed New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title_short New modal wave-front sensor: application to adaptive confocal fluorescence microscopy and two-photon excitation fluorescence microscopy.
title_sort new modal wave front sensor application to adaptive confocal fluorescence microscopy and two photon excitation fluorescence microscopy
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AT neilm newmodalwavefrontsensorapplicationtoadaptiveconfocalfluorescencemicroscopyandtwophotonexcitationfluorescencemicroscopy
AT wilsont newmodalwavefrontsensorapplicationtoadaptiveconfocalfluorescencemicroscopyandtwophotonexcitationfluorescencemicroscopy