Bonilla, S. (2020). Data for Charge Fluctuations at the Si-SiO2 Interface and its Effect on Surface Recombination in Solar Cells. University of Oxford.
Citace podle Chicago (17th ed.)Bonilla, S. Data for Charge Fluctuations at the Si-SiO2 Interface and Its Effect on Surface Recombination in Solar Cells. University of Oxford, 2020.
Citace podle MLA (9th ed.)Bonilla, S. Data for Charge Fluctuations at the Si-SiO2 Interface and Its Effect on Surface Recombination in Solar Cells. University of Oxford, 2020.
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