Bonilla, S. (2020). Data for Charge Fluctuations at the Si-SiO2 Interface and its Effect on Surface Recombination in Solar Cells. University of Oxford.
芝加哥风格引文Bonilla, S. Data for Charge Fluctuations at the Si-SiO2 Interface and Its Effect on Surface Recombination in Solar Cells. University of Oxford, 2020.
MLA引文Bonilla, S. Data for Charge Fluctuations at the Si-SiO2 Interface and Its Effect on Surface Recombination in Solar Cells. University of Oxford, 2020.
警告：这些引文格式不一定是100％准确.