Data for Charge Fluctuations at the Si-SiO2 Interface and its Effect on Surface Recombination in Solar Cells

Measurement and simulated data on properties of semiconductor materials. Data is packed inside the elements of Matlab figures, directly applicable to the figures in the manuscript.

Bibliographic Details
Main Author: Bonilla, S
Format: Dataset
Language:English
Published: University of Oxford 2020
Subjects:
Description
Summary:Measurement and simulated data on properties of semiconductor materials. Data is packed inside the elements of Matlab figures, directly applicable to the figures in the manuscript.