Data for Charge Fluctuations at the Si-SiO2 Interface and its Effect on Surface Recombination in Solar Cells

Measurement and simulated data on properties of semiconductor materials. Data is packed inside the elements of Matlab figures, directly applicable to the figures in the manuscript.

書誌詳細
第一著者: Bonilla, S
フォーマット: Dataset
言語:English
出版事項: University of Oxford 2020
主題: