Data for Charge Fluctuations at the Si-SiO2 Interface and its Effect on Surface Recombination in Solar Cells
Measurement and simulated data on properties of semiconductor materials. Data is packed inside the elements of Matlab figures, directly applicable to the figures in the manuscript.
| Үндсэн зохиолч: | |
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| Формат: | Dataset |
| Хэл сонгох: | English |
| Хэвлэсэн: |
University of Oxford
2020
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| Нөхцлүүд: |