Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.

We compare the dispersion relations for spinodally dewetting thin liquid films for increasing magnitude of interfacial slip length in the lubrication limit. While the shape of the dispersion relation, in particular the position of the maximum, are equal for no-slip up to moderate-slip lengths, the p...

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Main Authors: Rauscher, M, Blossey, R, Münch, A, Wagner, B
Format: Journal article
Language:English
Published: 2008
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author Rauscher, M
Blossey, R
Münch, A
Wagner, B
author_facet Rauscher, M
Blossey, R
Münch, A
Wagner, B
author_sort Rauscher, M
collection OXFORD
description We compare the dispersion relations for spinodally dewetting thin liquid films for increasing magnitude of interfacial slip length in the lubrication limit. While the shape of the dispersion relation, in particular the position of the maximum, are equal for no-slip up to moderate-slip lengths, the position of the maximum shifts to much larger wavelengths for large slip lengths. Here, we discuss the implications of this fact for recently developed methods to assess the disjoining pressure in spinodally unstable thin films by measuring the shape of the roughness power spectrum. For polystyrene (PS) films on octadecyltrichlorosilane (OTS) covered Si wafers (with slip length b approximately 1 microm), we predict a 20% shift of the position of the maximum of the power spectrum which should be detectable in experiments.
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spelling oxford-uuid:a64e93b4-bf40-4639-be9d-f5fd7f00cea32022-03-27T02:46:20ZSpinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:a64e93b4-bf40-4639-be9d-f5fd7f00cea3EnglishSymplectic Elements at Oxford2008Rauscher, MBlossey, RMünch, AWagner, BWe compare the dispersion relations for spinodally dewetting thin liquid films for increasing magnitude of interfacial slip length in the lubrication limit. While the shape of the dispersion relation, in particular the position of the maximum, are equal for no-slip up to moderate-slip lengths, the position of the maximum shifts to much larger wavelengths for large slip lengths. Here, we discuss the implications of this fact for recently developed methods to assess the disjoining pressure in spinodally unstable thin films by measuring the shape of the roughness power spectrum. For polystyrene (PS) films on octadecyltrichlorosilane (OTS) covered Si wafers (with slip length b approximately 1 microm), we predict a 20% shift of the position of the maximum of the power spectrum which should be detectable in experiments.
spellingShingle Rauscher, M
Blossey, R
Münch, A
Wagner, B
Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title_full Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title_fullStr Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title_full_unstemmed Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title_short Spinodal dewetting of thin films with large interfacial slip: implications from the dispersion relation.
title_sort spinodal dewetting of thin films with large interfacial slip implications from the dispersion relation
work_keys_str_mv AT rauscherm spinodaldewettingofthinfilmswithlargeinterfacialslipimplicationsfromthedispersionrelation
AT blosseyr spinodaldewettingofthinfilmswithlargeinterfacialslipimplicationsfromthedispersionrelation
AT muncha spinodaldewettingofthinfilmswithlargeinterfacialslipimplicationsfromthedispersionrelation
AT wagnerb spinodaldewettingofthinfilmswithlargeinterfacialslipimplicationsfromthedispersionrelation