Test set generation and fault localization software for reversible circuits
We discuss some properties of reversible circuits that allow them to be tested more efficiently than their classical counterparts, and give an analysis of currently proposed fault models. We also present an efficient algorithm that can be used to generate fault localization trees for large circuits.
| Автори: | , , |
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| Формат: | Journal article |
| Опубліковано: |
2005
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| Резюме: | We discuss some properties of reversible circuits that allow them to be tested more efficiently than their classical counterparts, and give an analysis of currently proposed fault models. We also present an efficient algorithm that can be used to generate fault localization trees for large circuits. |
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