A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY

The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivit...

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Bibliografiske detaljer
Main Authors: Zarbakhsh, A, Cowlam, N, Highmore, R, Evetts, J, Penfold, J, Shackleton, C
Format: Journal article
Sprog:English
Udgivet: 1990
Beskrivelse
Summary:The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivity with wavelength observed for the samples shows very clearly a structure which changes during the reaction. This illustrates the considerable potential of the neutron reflectivity method.