A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY
The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivit...
Täydet tiedot
Bibliografiset tiedot
| Päätekijät: |
Zarbakhsh, A,
Cowlam, N,
Highmore, R,
Evetts, J,
Penfold, J,
Shackleton, C |
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| Aineistotyyppi: | Journal article
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| Kieli: | English |
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| Julkaistu: |
1990
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