A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY
The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivit...
Hauptverfasser: | , , , , , |
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Format: | Journal article |
Sprache: | English |
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1990
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_version_ | 1826289539018129408 |
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author | Zarbakhsh, A Cowlam, N Highmore, R Evetts, J Penfold, J Shackleton, C |
author_facet | Zarbakhsh, A Cowlam, N Highmore, R Evetts, J Penfold, J Shackleton, C |
author_sort | Zarbakhsh, A |
collection | OXFORD |
description | The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivity with wavelength observed for the samples shows very clearly a structure which changes during the reaction. This illustrates the considerable potential of the neutron reflectivity method. |
first_indexed | 2024-03-07T02:30:24Z |
format | Journal article |
id | oxford-uuid:a70b39dc-b67d-4276-a44a-52030c59f72c |
institution | University of Oxford |
language | English |
last_indexed | 2024-03-07T02:30:24Z |
publishDate | 1990 |
record_format | dspace |
spelling | oxford-uuid:a70b39dc-b67d-4276-a44a-52030c59f72c2022-03-27T02:51:46ZA STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRYJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:a70b39dc-b67d-4276-a44a-52030c59f72cEnglishSymplectic Elements at Oxford1990Zarbakhsh, ACowlam, NHighmore, REvetts, JPenfold, JShackleton, CThe critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivity with wavelength observed for the samples shows very clearly a structure which changes during the reaction. This illustrates the considerable potential of the neutron reflectivity method. |
spellingShingle | Zarbakhsh, A Cowlam, N Highmore, R Evetts, J Penfold, J Shackleton, C A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title | A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title_full | A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title_fullStr | A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title_full_unstemmed | A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title_short | A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY |
title_sort | study of the amorphization reaction in ni zr multilayers by neutron reflectometry |
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