A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY

A STUDY OF THE AMORPHIZATION REACTION IN NI-ZR MULTILAYERS BY NEUTRON REFLECTOMETRY

The critical neutron spectrometer, CRISP, at the ISIS pulsed neutron source at the Rutherford Appleton Laboratory has been used for an in situ study of the solid-state amorphisation reaction in sputtered multilayer Ni-Zr thin films heated to 235 degrees C in air. The variation of neutron reflectivit...

Bibliografiset tiedot
Päätekijät:	Zarbakhsh, A, Cowlam, N, Highmore, R, Evetts, J, Penfold, J, Shackleton, C
Aineistotyyppi:	Journal article
Kieli:	English
Julkaistu:	1990

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