APA引文

Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.

Chicago Style (17th ed.) Citation

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

MLA引文

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

警告：這些引文格式不一定是100％准確.