Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.
Cita Chicago (17th ed.)Meyer, R., i A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Cita MLA (9th ed.)Meyer, R., i A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Atenció: Aquestes cites poden no estar 100% correctes.