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Dyfyniad Arddull ChicagoMeyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Dyfyniad MLAMeyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.