Cita APA (7a ed.)

Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.

Cita Chicago Style (17a ed.)

Meyer, R., y A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

Cita MLA (9a ed.)

Meyer, R., y A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.