APA aipamena

Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.

Chicago Style aipamena

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

MLA aipamena

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

Kontuz: berrikusi erreferentzia hauek erabili aurretik.