Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.
Style de citation Chicago (17e éd.)Meyer, R., et A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Style de citation MLA (9e éd.)Meyer, R., et A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
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