Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.
Lua i Stíl Chicago (17ú heag.)Meyer, R., agus A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Lua MLA (9ú heag.)Meyer, R., agus A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Rabhadh: Seans nach mbeach na luanna seo go hiomlán cruinn i ngach uile chás.