Cita APA

Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.

Citación estilo Chicago

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

Cita MLA

Meyer, R., and A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.

Warning: These citations may not always be 100% accurate.