Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.
Chicago-čujuhus (17. p.)Meyer, R., juo A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
MLA-čujuhus (9. p.)Meyer, R., juo A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
Muitte dárkkistit čujuhemiid riektatvuođa, ovdal go geavahat daid iežat deavsttas.