Meyer, R., & Kirkland, A. (2004). Measuring isoplanaticity in high-resolution electron microscopy.
芝加哥风格引文Meyer, R., 与 A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
MLA引文Meyer, R., 与 A. Kirkland. Measuring Isoplanaticity in High-resolution Electron Microscopy. 2004.
警告：这些引文格式不一定是100％准确.