Measuring isoplanaticity in high-resolution electron microscopy

Measuring isoplanaticity in high-resolution electron microscopy

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...

Descrizione completa

Dettagli Bibliografici
Autori principali:	Meyer, R, Kirkland, A
Natura:	Conference item
Pubblicazione:	2004

Documenti analoghi

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
di: Kirkland, A, et al.
Pubblicazione: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
di: Kirkland, A, et al.
Pubblicazione: (2004)

Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology
di: Tamar van Gardingen-Cromwijk, et al.
Pubblicazione: (2024-02-01)

Calculations of limited coherence for high resolution electron microscopy
di: Chang, L, et al.
Pubblicazione: (2004)

Restoration of Videos Degraded by Local Isoplanatism Effects in the Near-Infrared Domain
di: Magali Lemaitre, et al.
Pubblicazione: (2009-04-01)

Structural study of colloidal oxides by high resolution electron microscopy
di: Kirkland, A, et al.
Pubblicazione: (1991)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
di: Ciston, J, et al.
Pubblicazione: (2009)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
di: Kirkland, A, et al.
Pubblicazione: (2004)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
di: Haigh, S, et al.
Pubblicazione: (2010)

High-resolution electron microscopy /
di: 233349 Spence, John C. H.
Pubblicazione: (2003)

Measuring the Interpretability of High-Resolution Transmission Electron Microscopy Images
di: Lomholdt William Bang, et al.
Pubblicazione: (2024-01-01)

Structural characterization of the n = 5 layered perovskite neodymium titanate using high-resolution transmission electron microscopy and image reconstruction.
di: Sayagués, M, et al.
Pubblicazione: (2003)

In‐Situ annealing of the (110) and (001) surfaces of SrTiO3 nanocuboids by high‐resolution transmission electron microscopy
di: Liberti, E, et al.
Pubblicazione: (2018)

Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy.
di: Young, N, et al.
Pubblicazione: (2010)

Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy
di: Young, N, et al.
Pubblicazione: (2010)

Experimental high-resolution electron microscopy /
di: 233349 Spence, John C. H.
Pubblicazione: (1988)

Experimental high-resolution electron microscopy /
di: 233349 Spence, John C. H.
Pubblicazione: (1981)

In-situ electron microscopy at high resolution /
di: Banhart, Florian
Pubblicazione: (2008)

A JOINT STRUCTURAL CHARACTERIZATION OF COLLOIDAL PLATINUM BY EXAFS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
di: Duff, D, et al.
Pubblicazione: (1989)

High-resolution electron microscopy of dislocation geometries
di: Holmes, S
Pubblicazione: (1975)

High-resolution electron microscopy and associated techniques/
di: Cowley, J. M. (John Maxwell), 1923-, et al.
Pubblicazione: (1988)

Direct Detectors for Electron Microscopy
di: Clough, R, et al.
Pubblicazione: (2014)

High-resolution correlative imaging in ultrafast electron microscopy
di: Ye-Jin Kim, et al.
Pubblicazione: (2024-12-01)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
di: Kirkland, A, et al.
Pubblicazione: (2008)

A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
di: Meyer, R, et al.
Pubblicazione: (2004)

A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
di: Meyer, R, et al.
Pubblicazione: (2002)

A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy
di: Ming, W, et al.
Pubblicazione: (2017)

Direct and indirect electron microscopy of encapsulated nanocrystals
di: Kirkland, A, et al.
Pubblicazione: (2002)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
di: Lan, Yucheng, et al.
Pubblicazione: (2011)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
di: Yucheng Lan, et al.
Pubblicazione: (2010-01-01)

High-resolution transmission electron microscopy with an electrostatic Zach phase plate
di: S Hettler, et al.
Pubblicazione: (2016-01-01)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF THE HIGH-TC SUPERCONDUCTOR BI2+XSR2CA1-XCU2O8+SIGMA
di: Zhou, W, et al.
Pubblicazione: (1989)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TUBULE-CONTAINING GRAPHITIC CARBON
di: Harris, P, et al.
Pubblicazione: (1993)

High-resolution electron microscopy studies of non-graphitizing carbons
di: Harris, P, et al.
Pubblicazione: (1997)

High-resolution electron microscopy studies of non-graphitizing carbons
di: Harris, P, et al.
Pubblicazione: (1997)

High-resolution electron microscopy of tubule-containing graphitic carbon
di: Harris, P, et al.
Pubblicazione: (1993)

Crystal interface and high-resolution electron microscopy—the best partner
di: H Ichinose
Pubblicazione: (2000-01-01)

Structural engineering of graphene for high‐resolution cryo‐electron microscopy
di: Jie Xu, et al.
Pubblicazione: (2021-07-01)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
di: Kirkland, A, et al.
Pubblicazione: (2008)

High quality graphene TEM supports for high-resolution transmission electron microscopy
di: Verstraelen Jenthe, et al.
Pubblicazione: (2024-01-01)