Measuring isoplanaticity in high-resolution electron microscopy
We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...
| Հիմնական հեղինակներ: | , |
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| Ձևաչափ: | Conference item |
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2004
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