Measuring isoplanaticity in high-resolution electron microscopy

Measuring isoplanaticity in high-resolution electron microscopy

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...

Cur síos iomlán

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Meyer, R, Kirkland, A
Formáid:	Conference item
Foilsithe / Cruthaithe:	2004

Míreanna comhchosúla

Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology
de réir: Tamar van Gardingen-Cromwijk, et al.
Foilsithe / Cruthaithe: (2024-02-01)

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2004)

Calculations of limited coherence for high resolution electron microscopy
de réir: Chang, L, et al.
Foilsithe / Cruthaithe: (2004)

Structural study of colloidal oxides by high resolution electron microscopy
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (1991)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
de réir: Ciston, J, et al.
Foilsithe / Cruthaithe: (2009)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2004)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
de réir: Haigh, S, et al.
Foilsithe / Cruthaithe: (2010)

High-resolution electron microscopy /
de réir: 233349 Spence, John C. H.
Foilsithe / Cruthaithe: (2003)

Measuring the Interpretability of High-Resolution Transmission Electron Microscopy Images
de réir: Lomholdt William Bang, et al.
Foilsithe / Cruthaithe: (2024-01-01)

Structural characterization of the n = 5 layered perovskite neodymium titanate using high-resolution transmission electron microscopy and image reconstruction.
de réir: Sayagués, M, et al.
Foilsithe / Cruthaithe: (2003)

In‐Situ annealing of the (110) and (001) surfaces of SrTiO3 nanocuboids by high‐resolution transmission electron microscopy
de réir: Liberti, E, et al.
Foilsithe / Cruthaithe: (2018)

Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy.
de réir: Young, N, et al.
Foilsithe / Cruthaithe: (2010)

Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy
de réir: Young, N, et al.
Foilsithe / Cruthaithe: (2010)

Experimental high-resolution electron microscopy /
de réir: 233349 Spence, John C. H.
Foilsithe / Cruthaithe: (1988)

Experimental high-resolution electron microscopy /
de réir: 233349 Spence, John C. H.
Foilsithe / Cruthaithe: (1981)

In-situ electron microscopy at high resolution /
de réir: Banhart, Florian
Foilsithe / Cruthaithe: (2008)

A JOINT STRUCTURAL CHARACTERIZATION OF COLLOIDAL PLATINUM BY EXAFS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
de réir: Duff, D, et al.
Foilsithe / Cruthaithe: (1989)

High-resolution electron microscopy of dislocation geometries
de réir: Holmes, S
Foilsithe / Cruthaithe: (1975)

High-resolution electron microscopy and associated techniques/
de réir: Cowley, J. M. (John Maxwell), 1923-, et al.
Foilsithe / Cruthaithe: (1988)

Direct Detectors for Electron Microscopy
de réir: Clough, R, et al.
Foilsithe / Cruthaithe: (2014)

High-resolution correlative imaging in ultrafast electron microscopy
de réir: Ye-Jin Kim, et al.
Foilsithe / Cruthaithe: (2024-12-01)

A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
de réir: Meyer, R, et al.
Foilsithe / Cruthaithe: (2004)

A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
de réir: Meyer, R, et al.
Foilsithe / Cruthaithe: (2002)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2008)

A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy
de réir: Ming, W, et al.
Foilsithe / Cruthaithe: (2017)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
de réir: Lan, Yucheng, et al.
Foilsithe / Cruthaithe: (2011)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
de réir: Yucheng Lan, et al.
Foilsithe / Cruthaithe: (2010-01-01)

High-resolution transmission electron microscopy with an electrostatic Zach phase plate
de réir: S Hettler, et al.
Foilsithe / Cruthaithe: (2016-01-01)

Direct and indirect electron microscopy of encapsulated nanocrystals
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2002)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TUBULE-CONTAINING GRAPHITIC CARBON
de réir: Harris, P, et al.
Foilsithe / Cruthaithe: (1993)

High-resolution electron microscopy studies of non-graphitizing carbons
de réir: Harris, P, et al.
Foilsithe / Cruthaithe: (1997)

High-resolution electron microscopy studies of non-graphitizing carbons
de réir: Harris, P, et al.
Foilsithe / Cruthaithe: (1997)

High-resolution electron microscopy of tubule-containing graphitic carbon
de réir: Harris, P, et al.
Foilsithe / Cruthaithe: (1993)

Crystal interface and high-resolution electron microscopy—the best partner
de réir: H Ichinose
Foilsithe / Cruthaithe: (2000-01-01)

Structural engineering of graphene for high‐resolution cryo‐electron microscopy
de réir: Jie Xu, et al.
Foilsithe / Cruthaithe: (2021-07-01)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF THE HIGH-TC SUPERCONDUCTOR BI2+XSR2CA1-XCU2O8+SIGMA
de réir: Zhou, W, et al.
Foilsithe / Cruthaithe: (1989)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
de réir: Kirkland, A, et al.
Foilsithe / Cruthaithe: (2008)

High quality graphene TEM supports for high-resolution transmission electron microscopy
de réir: Verstraelen Jenthe, et al.
Foilsithe / Cruthaithe: (2024-01-01)

High-resolution transmission electron microscopy of III-V FinFETs
de réir: Kong, Lisa (Lisa Fanzhen)
Foilsithe / Cruthaithe: (2018)