Measuring isoplanaticity in high-resolution electron microscopy

Measuring isoplanaticity in high-resolution electron microscopy

We recently reported on a new method for the accurate determination of the symmetric aberration coefficients (defocus and twofold astigmatism) from a focal series of high resolution images based on an analysis of the image Fourier transform phases. This can be extended to also cover the antisymmetri...

Bibliográfalaš dieđut
Váldodahkkit:	Meyer, R, Kirkland, A
Materiálatiipa:	Conference item
Almmustuhtton:	2004

Geahča maid

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2004)

Non-isoplanatic lens aberration correction in dark-field digital holographic microscopy for semiconductor metrology
Dahkki: Tamar van Gardingen-Cromwijk, et al.
Almmustuhtton: (2024-02-01)

Calculations of limited coherence for high resolution electron microscopy
Dahkki: Chang, L, et al.
Almmustuhtton: (2004)

Restoration of Videos Degraded by Local Isoplanatism Effects in the Near-Infrared Domain
Dahkki: Magali Lemaitre, et al.
Almmustuhtton: (2009-04-01)

Structural study of colloidal oxides by high resolution electron microscopy
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Almmustuhtton: (1991)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
Dahkki: Ciston, J, et al.
Almmustuhtton: (2009)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2004)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
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Almmustuhtton: (2010)

High-resolution electron microscopy /
Dahkki: 233349 Spence, John C. H.
Almmustuhtton: (2003)

Measuring the Interpretability of High-Resolution Transmission Electron Microscopy Images
Dahkki: Lomholdt William Bang, et al.
Almmustuhtton: (2024-01-01)

Structural characterization of the n = 5 layered perovskite neodymium titanate using high-resolution transmission electron microscopy and image reconstruction.
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Almmustuhtton: (2003)

In‐Situ annealing of the (110) and (001) surfaces of SrTiO3 nanocuboids by high‐resolution transmission electron microscopy
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Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy.
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Almmustuhtton: (2010)

Transformations of gold nanoparticles investigated using variable temperature high-resolution transmission electron microscopy
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Almmustuhtton: (2010)

Experimental high-resolution electron microscopy /
Dahkki: 233349 Spence, John C. H.
Almmustuhtton: (1988)

Experimental high-resolution electron microscopy /
Dahkki: 233349 Spence, John C. H.
Almmustuhtton: (1981)

In-situ electron microscopy at high resolution /
Dahkki: Banhart, Florian
Almmustuhtton: (2008)

A JOINT STRUCTURAL CHARACTERIZATION OF COLLOIDAL PLATINUM BY EXAFS AND HIGH-RESOLUTION ELECTRON-MICROSCOPY
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Almmustuhtton: (1989)

High-resolution electron microscopy of dislocation geometries
Dahkki: Holmes, S
Almmustuhtton: (1975)

High-resolution electron microscopy and associated techniques/
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Almmustuhtton: (1988)

Direct Detectors for Electron Microscopy
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Almmustuhtton: (2014)

High-resolution correlative imaging in ultrafast electron microscopy
Dahkki: Ye-Jin Kim, et al.
Almmustuhtton: (2024-12-01)

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2008)

A new method for the determination of the wave aberration function for high-resolution TEM.; 2. Measurement of the antisymmetric aberrations.
Dahkki: Meyer, R, et al.
Almmustuhtton: (2004)

A new method for the determination of the wave aberration function for high resolution TEM 1. Measurement of the symmetric aberrations.
Dahkki: Meyer, R, et al.
Almmustuhtton: (2002)

A quantitative method for measuring small residual beam tilts in high-resolution transmission electron microscopy
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Almmustuhtton: (2017)

Direct and indirect electron microscopy of encapsulated nanocrystals
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2002)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
Dahkki: Lan, Yucheng, et al.
Almmustuhtton: (2011)

Grids for Applications in High-Temperature High-Resolution Transmission Electron Microscopy
Dahkki: Yucheng Lan, et al.
Almmustuhtton: (2010-01-01)

High-resolution transmission electron microscopy with an electrostatic Zach phase plate
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Almmustuhtton: (2016-01-01)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF THE HIGH-TC SUPERCONDUCTOR BI2+XSR2CA1-XCU2O8+SIGMA
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Almmustuhtton: (1989)

HIGH-RESOLUTION ELECTRON-MICROSCOPY OF TUBULE-CONTAINING GRAPHITIC CARBON
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High-resolution electron microscopy studies of non-graphitizing carbons
Dahkki: Harris, P, et al.
Almmustuhtton: (1997)

High-resolution electron microscopy studies of non-graphitizing carbons
Dahkki: Harris, P, et al.
Almmustuhtton: (1997)

High-resolution electron microscopy of tubule-containing graphitic carbon
Dahkki: Harris, P, et al.
Almmustuhtton: (1993)

Crystal interface and high-resolution electron microscopy—the best partner
Dahkki: H Ichinose
Almmustuhtton: (2000-01-01)

Structural engineering of graphene for high‐resolution cryo‐electron microscopy
Dahkki: Jie Xu, et al.
Almmustuhtton: (2021-07-01)

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Dahkki: Kirkland, A, et al.
Almmustuhtton: (2008)

High quality graphene TEM supports for high-resolution transmission electron microscopy
Dahkki: Verstraelen Jenthe, et al.
Almmustuhtton: (2024-01-01)