Finding phase information in the darkness
High resolution local structure information is revealed when the complex exit wavefunction is restored from a series of transmission electron microscope (TEM) images. Aberration corrected image data sets allow high spatial frequency information to be restored but this is often at the expense of lowe...
| Автори: | , |
|---|---|
| Формат: | Conference item |
| Опубліковано: |
2010
|