Schäfer, N., Wilkinson, A., Schmid, T., Winkelmann, A., Chahine, G., Schülli, T., . . . Abou-Ras, D. (2016). Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. Elsevier.
توثيق أسلوب شيكاغو (الطبعة السابعة عشر)Schäfer, N., et al. Microstrain Distribution Mapping on CuInSe2 Thin Films by Means of Electron Backscatter Diffraction, X-ray Diffraction, and Raman Microspectroscopy. Elsevier, 2016.
توثيق جمعية اللغة المعاصرة MLA (الإصدار التاسع)Schäfer, N., et al. Microstrain Distribution Mapping on CuInSe2 Thin Films by Means of Electron Backscatter Diffraction, X-ray Diffraction, and Raman Microspectroscopy. Elsevier, 2016.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.