Schäfer, N., Wilkinson, A., Schmid, T., Winkelmann, A., Chahine, G., Schülli, T., . . . Abou-Ras, D. (2016). Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy. Elsevier.
Style de citation Chicago (17e éd.)Schäfer, N., et al. Microstrain Distribution Mapping on CuInSe2 Thin Films by Means of Electron Backscatter Diffraction, X-ray Diffraction, and Raman Microspectroscopy. Elsevier, 2016.
Style de citation MLA (9e éd.)Schäfer, N., et al. Microstrain Distribution Mapping on CuInSe2 Thin Films by Means of Electron Backscatter Diffraction, X-ray Diffraction, and Raman Microspectroscopy. Elsevier, 2016.
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