$Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.$

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.

The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure-property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of th...

Ամբողջական նկարագրություն

Մատենագիտական մանրամասներ
Հիմնական հեղինակներ:	Schäfer, N, Wilkinson, A, Schmid, T, Winkelmann, A, Chahine, G, Schülli, T, Rissom, T, Marquardt, J, Schorr, S, Abou-Ras, D
Ձևաչափ:	Journal article
Լեզու:	English
Հրապարակվել է:	Elsevier 2016

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