$Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.$

Microstrain distribution mapping on CuInSe2 thin films by means of electron backscatter diffraction, X-ray diffraction, and Raman microspectroscopy.

The investigation of the microstructure in functional, polycrystalline thin films is an important contribution to the enhanced understanding of structure-property relationships in corresponding devices. Linear and planar defects within individual grains may affect substantially the performance of th...

Mô tả đầy đủ

Chi tiết về thư mục
Những tác giả chính:	Schäfer, N, Wilkinson, A, Schmid, T, Winkelmann, A, Chahine, G, Schülli, T, Rissom, T, Marquardt, J, Schorr, S, Abou-Ras, D
Định dạng:	Journal article
Ngôn ngữ:	English
Được phát hành:	Elsevier 2016

Những quyển sách tương tự

Microstrain distributions in polycrystalline thin film measured by X-ray microdiffraction
Bằng: Wilkinson, A, et al.
Được phát hành: (2016)

Electron backscatter diffraction: An important tool for analyses of structure-property relationships in thin-film solar cells
Bằng: Abou-Ras, D, et al.
Được phát hành: (2013)

Strain mapping using electron backscatter diffraction
Bằng: Wilkinson, A, et al.
Được phát hành: (2009)

Direct detection of electron backscatter diffraction patterns.
Bằng: Wilkinson, A, et al.
Được phát hành: (2013)

Crystallite Size and Microstrain Measurement of Cathode Material after Mechanical Milling using Neutron Diffraction Technique
Bằng: A. Fajar, et al.
Được phát hành: (2010-12-01)

Electron Backscatter Diffraction: An Important Tool for Analyses of Structure-Property Relationships in Thin-Film Solar Cells
Bằng: Abou-Ras, D, et al.
Được phát hành: (2013)

Electron backscatter diffraction in the silicon nanowires
Bằng: K.K. Dikhanbayev, et al.
Được phát hành: (2016-10-01)

Measurement of plastic strain of polycrystalline material by electron backscatter diffraction
Bằng: Kamaya, M, et al.
Được phát hành: (2005)

Applications of multivariate statistical methods and simulation libraries to analysis of electron backscatter diffraction and transmission Kikuchi diffraction datasets
Bằng: Wilkinson, A, et al.
Được phát hành: (2018)

Tetragonality of Fe-C martensite – a pattern matching electron backscatter diffraction analysis compared to X-ray diffraction
Bằng: Tanaka, T, et al.
Được phát hành: (2020)

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging
Bằng: Trager-Cowan, C, et al.
Được phát hành: (2006)

Raman microspectroscopy for microbiology
Bằng: Lee, KS, et al.
Được phát hành: (2021)

High resolution mapping of strains and rotations using electron backscatter diffraction
Bằng: Wilkinson, A, et al.
Được phát hành: (2013)

High resolution mapping of strains and rotations using electron backscatter diffraction
Bằng: Wilkinson, A, et al.
Được phát hành: (2006)

Elastic strain tensor measurement using electron backscatter diffraction in the SEM.
Bằng: Dingley, D, et al.
Được phát hành: (2010)

High-resolution electron backscatter diffraction in III-nitride semiconductors
Bằng: Vilalta-Clemente, A, et al.
Được phát hành: (2015)

Analysis of dislocation densities using high resolution electron backscatter diffraction
Bằng: Vilalta-Clemente, A, et al.
Được phát hành: (2015)

Quantification of plastic strain of stainless steel and nickel alloy by electron backscatter diffraction
Bằng: Kamaya, M, et al.
Được phát hành: (2006)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Bằng: Naresh-Kumar, G, et al.
Được phát hành: (2017)

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns
Bằng: Wilkinson, A
Được phát hành: (1997)

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
Bằng: Tong, V, et al.
Được phát hành: (2015)

Quantitative imaging of anti-phase domains by polarity sensitive orientation mapping using electron backscatter diffraction
Bằng: G. Naresh-Kumar, et al.
Được phát hành: (2017-09-01)

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
Bằng: Britton, T, et al.
Được phát hành: (2011)

Rapid electron backscatter diffraction mapping: painting by numbers
Bằng: Tong, V, et al.
Được phát hành: (2018)

Application of Electron Backscatter Diffraction to Calcite-Twinning Paleopiezometry
Bằng: Ernest Rutter, et al.
Được phát hành: (2022-05-01)

High-resolution electron backscatter diffraction: an emerging tool for studying local deformation
Bằng: Wilkinson, A, et al.
Được phát hành: (2010)

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
Bằng: Yang, D, et al.
Được phát hành: (2022)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
Bằng: Wilkinson, A
Được phát hành: (2006)

High resolution measurements of strain and tilt distributions in SiGe mesas using electron backscatter diffraction
Bằng: Wilkinson, A
Được phát hành: (2006)

High resolution electron backscatter diffraction measurements of elastic strain variations in the presence of larger lattice rotations.
Bằng: Britton, T, et al.
Được phát hành: (2012)

An iterative method for reference pattern selection in high-resolution electron backscatter diffraction (HR-EBSD)
Bằng: Koko, A, et al.
Được phát hành: (2023)

Distribution and formation mechanism of residual stress in duplex stainless steel weld joint by neutron diffraction and electron backscatter diffraction
Bằng: Yu Wan, et al.
Được phát hành: (2019-11-01)

Characterization of nitride thin films by electron backscatter diffraction and electron channeling contrast imaging
Bằng: Trager-Cowan, C, et al.
Được phát hành: (2006)

Determination of the structural and luminescence properties of nitrides using electron backscattered diffraction and photo- and cathodoluminescence
Bằng: Trager-Cowan, C, et al.
Được phát hành: (2002)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
Bằng: Tucker, A, et al.
Được phát hành: (2000)

Measurement of fatigue crack plastic zones in fine grained materials using electron backscattered diffraction
Bằng: Tucker, A, et al.
Được phát hành: (2000)

Assessing the precision of strain measurements using electron backscatter diffraction--part 1: detector assessment.
Bằng: Britton, T, et al.
Được phát hành: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction--part 2: experimental demonstration.
Bằng: Britton, T, et al.
Được phát hành: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - part 1: Detector assessment
Bằng: Britton, T, et al.
Được phát hành: (2013)

Assessing the precision of strain measurements using electron backscatter diffraction - Part 2: Experimental demonstration
Bằng: Britton, T, et al.
Được phát hành: (2013)