Transmission electron microscopy investigation of Bi-based HTS tapes
Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. 5The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain b...
| Main Authors: | , , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
1997
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| _version_ | 1797087551540953088 |
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| author | Eastell, C Henry, B Morgan, C Grovenor, C Goringe, M Burgoyne, J Dew-Hughes, D |
| author_facet | Eastell, C Henry, B Morgan, C Grovenor, C Goringe, M Burgoyne, J Dew-Hughes, D |
| author_sort | Eastell, C |
| collection | OXFORD |
| description | Bi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. 5The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain boundaries, residual 2212 layers present at grain boundaries and inside grains, and secondary phases. The Ag/superconductor interface has been shown to be relatively planar with no amorphous phases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface. © 1997 IEEE. |
| first_indexed | 2024-03-07T02:37:14Z |
| format | Journal article |
| id | oxford-uuid:a9348890-2a5d-434b-9b26-25d6a534f9f0 |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T02:37:14Z |
| publishDate | 1997 |
| record_format | dspace |
| spelling | oxford-uuid:a9348890-2a5d-434b-9b26-25d6a534f9f02022-03-27T03:06:52ZTransmission electron microscopy investigation of Bi-based HTS tapesJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:a9348890-2a5d-434b-9b26-25d6a534f9f0EnglishSymplectic Elements at Oxford1997Eastell, CHenry, BMorgan, CGrovenor, CGoringe, MBurgoyne, JDew-Hughes, DBi(Pb)-2223/Ag powder in tube tapes have been examined by TEM. 5The tapes show good alignment and phase purity in the SEM but TEM investigations revealed a number of fine-scale, current-limiting, features. Such features include variation in grain boundary structure, amorphous phases at twist grain boundaries, residual 2212 layers present at grain boundaries and inside grains, and secondary phases. The Ag/superconductor interface has been shown to be relatively planar with no amorphous phases with the Bi(Pb)-2223 having near perfect c-axis alignment at the interface. © 1997 IEEE. |
| spellingShingle | Eastell, C Henry, B Morgan, C Grovenor, C Goringe, M Burgoyne, J Dew-Hughes, D Transmission electron microscopy investigation of Bi-based HTS tapes |
| title | Transmission electron microscopy investigation of Bi-based HTS tapes |
| title_full | Transmission electron microscopy investigation of Bi-based HTS tapes |
| title_fullStr | Transmission electron microscopy investigation of Bi-based HTS tapes |
| title_full_unstemmed | Transmission electron microscopy investigation of Bi-based HTS tapes |
| title_short | Transmission electron microscopy investigation of Bi-based HTS tapes |
| title_sort | transmission electron microscopy investigation of bi based hts tapes |
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