Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope.
Transmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extend...
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| Format: | Journal article |
| Language: | English |
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2009
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| _version_ | 1826290133125562368 |
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| author | Haigh, S Sawada, H Kirkland, A |
| author_facet | Haigh, S Sawada, H Kirkland, A |
| author_sort | Haigh, S |
| collection | OXFORD |
| description | Transmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extends the ultimate resolution of the latest generation of aberration corrected transmission electron microscopes by 41% relative to that achievable using conventional axial imaging. Experimental results verify that a real space resolution of 78 pm has been achieved at 200 kV. |
| first_indexed | 2024-03-07T02:39:31Z |
| format | Journal article |
| id | oxford-uuid:a9f5c72c-1563-4590-b564-07c90370084d |
| institution | University of Oxford |
| language | English |
| last_indexed | 2024-03-07T02:39:31Z |
| publishDate | 2009 |
| record_format | dspace |
| spelling | oxford-uuid:a9f5c72c-1563-4590-b564-07c90370084d2022-03-27T03:11:55ZAtomic structure imaging beyond conventional resolution limits in the transmission electron microscope.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:a9f5c72c-1563-4590-b564-07c90370084dEnglishSymplectic Elements at Oxford2009Haigh, SSawada, HKirkland, ATransmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extends the ultimate resolution of the latest generation of aberration corrected transmission electron microscopes by 41% relative to that achievable using conventional axial imaging. Experimental results verify that a real space resolution of 78 pm has been achieved at 200 kV. |
| spellingShingle | Haigh, S Sawada, H Kirkland, A Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title | Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title_full | Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title_fullStr | Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title_full_unstemmed | Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title_short | Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope. |
| title_sort | atomic structure imaging beyond conventional resolution limits in the transmission electron microscope |
| work_keys_str_mv | AT haighs atomicstructureimagingbeyondconventionalresolutionlimitsinthetransmissionelectronmicroscope AT sawadah atomicstructureimagingbeyondconventionalresolutionlimitsinthetransmissionelectronmicroscope AT kirklanda atomicstructureimagingbeyondconventionalresolutionlimitsinthetransmissionelectronmicroscope |