Atomic structure imaging beyond conventional resolution limits in the transmission electron microscope.
Transmission electron microscopy is an extremely powerful technique for direct characterization of local structure at the atomic scale. However, the resolution of this technique is fundamentally limited by the partial coherence of the electron beam. In this Letter we demonstrate a method that extend...
| Main Authors: | , , |
|---|---|
| Format: | Journal article |
| Language: | English |
| Published: |
2009
|