PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Dades bibliogràfiques
Autors principals:	Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
Format:	Journal article
Publicat:	1995

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