PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

Manylion Llyfryddiaeth
Prif Awduron:	Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
Fformat:	Journal article
Cyhoeddwyd:	1995

Eitemau Tebyg

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Strains and Stresses in Multilayered Materials Determined Using High-Energy X-ray Diffraction
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X-Ray diffraction.

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Deformation in Metallic Glasses Studied by Synchrotron X-Ray Diffraction
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Structural Properties of He-Irradiated Zr/Nb Multilayer Investigated by Grazing Incidence X-ray Diffraction
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Demonstration of femtosecond X-ray pump X-ray probe diffraction on protein crystals
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X-ray Diffraction Studies
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X-ray Diffraction Studies
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X-Ray Diffraction Studies
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X-ray Diffraction Studies
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X-ray Diffraction Studies
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X-ray Diffraction Studies
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X-ray Diffraction Studies
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Structural and Chemical Characterization of Rasaparpati w.s.r to X-ray Diffraction
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Structural and Chemical Characterization of Rasaparpati w.s.r to X-ray Diffraction
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Discussion on the Precision Evaluation Method of Serpentine Phase Quantitative Analysis by X-ray Diffraction
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X-ray topographic study of defects in Si-based multilayer epitaxial power devices
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Transmission diffraction gratings for soft x-ray spectroscopy and spatial period division
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[001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001).
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