PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

PRECISE DETERMINATION OF THE PERIODICITY FOR MO/SI AND W/C METALLIC MULTILAYERS BY ELECTRON AND X-RAY-DIFFRACTION

書誌詳細
主要な著者:	Jiang, S, Zou, J, Cockayne, D, Hu, A, Sikorski, A
フォーマット:	Journal article
出版事項:	1995

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